Optical Interference Film Thickness Measurement Device "Model 3100"
An industry-standard device boasting a large number of delivery achievements! Equipped with linear array photodetectors.
The "Model3100" is an optical interference film thickness measurement device that employs a linear array sensor for high-speed measurement. By standardly equipping spectral analysis software, it enables simultaneous measurement of multilayer films (typically up to three layers) and measurement of optical constants (n, k). It allows for fine-tuned parameter settings suitable for various film characteristics, enabling more diverse film thickness measurements for various film structures. 【Features】 ■ Capable of measuring up to 70μm in equivalent oxide film thickness with a high-sensitivity, high-resolution head (optional) ■ 100x lens (for a micro spot of φ0.75μm) is also available ■ Easy implementation of program settings for special film measurements suited to the process ■ Supports various applications (magnetic heads, FPD, materials research, etc.) and allows for the creation of sample stages tailored to specific uses (optional) *For more details, please refer to the PDF materials or feel free to contact us.
- Company：アークステーション
- Price：Other
